dc.contributor.author |
Ghaffarian, Reza |
|
dc.date.accessioned |
2006-07-11T21:10:05Z |
|
dc.date.available |
2006-07-11T21:10:05Z |
|
dc.date.issued |
2005-02-22 |
|
dc.identifier.citation |
International Microelectronics and Packaging Society, Extreme Environment Workshop, Austin, Texas, February 22-24, 2005. |
en |
dc.identifier.clearanceno |
05-0530 |
|
dc.identifier.uri |
http://hdl.handle.net/2014/39492 |
|
dc.description.sponsorship |
NASA/JPL |
en |
dc.format.extent |
1804697 bytes |
|
dc.format.mimetype |
application/pdf |
|
dc.language.iso |
en_US |
en |
dc.publisher |
Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2005.' |
en |
dc.subject |
thermal cycles |
en |
dc.subject |
IPC specifications |
en |
dc.subject |
extreme cold |
en |
dc.subject |
solder joint |
en |
dc.title |
Package qualification and reliability for extreme environment |
en |
dc.type |
Presentation |
en |