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Items for Author "Qin, Jin"

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Issue DateTitleAuthor(s)
17-Oct-2005 Impact of device scaling on deep sub-micron transistor reliability : a study of reliability trends using SRAM White, Mark; Huang, Bing; Qin, Jin; Gur, Zvi; Talmor, Michael; Chen, Yuan; Heidecker, Jason; Nguyen, Duc; Bernstein, Joseph

 

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