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JPL TRS 1992+ >
Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/8695
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| Title: | NDE of microelectronics by real time x-ray imaging |
| Authors: | Mih, D. T. |
| Issue Date: | 30-May-2002 |
| Citation: | NASA 2002 Assurance Technology Conference
NASA GRC |
| URI: | http://hdl.handle.net/2014/8695 |
| Appears in Collections: | JPL TRS 1992+
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