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Title: Metrology system for Space Interferometry Mission system testbed 3
Authors: Azizi, A.
Alvarez-Salazar, O.
Goullioud, R.
Gursel, Y.
Issue Date: 16-May-2004
Citation: CLEO 2004
San Francisco, CA, USA
Abstract: In a 3-baseline interferometer fourteen metrology gauges are used to monitor changes in the two baselines and calculate the length of the third. Simulation for estimating the third baseline indicates measurement capability of better than 1 nm error.
Appears in Collections:JPL TRS 1992+

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