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Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/8021

Title: Metrology system for Space Interferometry Mission system testbed 3
Authors: Azizi, A.
Alvarez-Salazar, O.
Goullioud, R.
Gursel, Y.
Issue Date: 16-May-2004
Citation: CLEO 2004
San Francisco, CA, USA
Abstract: In a 3-baseline interferometer fourteen metrology gauges are used to monitor changes in the two baselines and calculate the length of the third. Simulation for estimating the third baseline indicates measurement capability of better than 1 nm error.
URI: http://hdl.handle.net/2014/8021
Appears in Collections:JPL TRS 1992+

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