|
BEACON eSpace at Jet Propulsion Laboratory >
JPL Technical Report Server >
JPL TRS 1992+ >
Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/7678
|
| Title: | Proton nonionizing energy loss (NIEL) for device applications |
| Authors: | Jun, I.
Xapsos, M. A.
Messenger, S. R.
Burke, E. A.
Walters, R. J.
Summers, G. P.
Jordan, T. |
| Issue Date: | 21-Jul-2003 |
| Citation: | IEEE Nuclear and Space Radiation Effects Conference
Monterey, California, USA |
| Abstract: | The proton induced NIEL for representative device materials are presented for the energy range between 1 keV to 1000 MeV. |
| URI: | http://hdl.handle.net/2014/7678 |
| Appears in Collections: | JPL TRS 1992+
|
Items in DSpace are protected by copyright, but are furnished with U.S. government purpose use rights.
|
