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|Title: ||Proton nonionizing energy loss (NIEL) for device applications|
|Authors: ||Jun, I.|
Xapsos, M. A.
Messenger, S. R.
Burke, E. A.
Walters, R. J.
Summers, G. P.
|Issue Date: ||21-Jul-2003 |
|Citation: ||IEEE Nuclear and Space Radiation Effects Conference|
Monterey, California, USA
|Abstract: ||The proton induced NIEL for representative device materials are presented for the energy range between 1 keV to 1000 MeV.|
|Appears in Collections:||JPL TRS 1992+|
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