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Title: Proton nonionizing energy loss (NIEL) for device applications
Authors: Jun, I.
Xapsos, M. A.
Messenger, S. R.
Burke, E. A.
Walters, R. J.
Summers, G. P.
Jordan, T.
Issue Date: 21-Jul-2003
Citation: IEEE Nuclear and Space Radiation Effects Conference
Monterey, California, USA
Abstract: The proton induced NIEL for representative device materials are presented for the energy range between 1 keV to 1000 MeV.
Appears in Collections:JPL TRS 1992+

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