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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/7223
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| Title: | Qualification and reliability testing of a microchip laser system for space applications |
| Authors: | Wright, M. W.
Franzen, D.
Hemmati, H.
Sandor, M. |
| Issue Date: | 7-Jul-2003 |
| Citation: | Electronic Packaging Technical Conference - InterPACK03
Maui, HI, USA |
| Abstract: | This paper discusses the process being used and the results of the selection and qualification of a low cost prepackaged diode laser with a custom packaged microchip laser crystal. |
| URI: | http://hdl.handle.net/2014/7223 |
| Appears in Collections: | JPL TRS 1992+
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