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|Title: ||Effects of electronic and strain boundary conditions in multi-million atom electronic structure simulations|
|Authors: ||Oyafuso, F.|
Boykin, T. B.
Bowen, R. C.
Allmen, P. von
|Issue Date: ||2-Mar-2003 |
|Citation: ||March Meeting of the American Physical Society|
Austin, TX, USA
|Appears in Collections:||JPL TRS 1992+|
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