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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/6627
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| Title: | Diagonal parameter shifts in strained semiconductors in the empirical tight-binding theory |
| Authors: | Boykin, T.
Klimeck, G.
Bowen, R. C.
Oyafuso, F. |
| Issue Date: | 2-Mar-2003 |
| Citation: | March Meeting of the American Physical Society
Austin, TX, USA |
| URI: | http://hdl.handle.net/2014/6627 |
| Appears in Collections: | JPL TRS 1992+
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