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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/42682
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| Title: | Initial SEE testing of Maestro |
| Authors: | Guertin, Steven M. |
| Keywords: | radiation effects
manycore microprocessor
multicore microprocessor
cache sensitivity
single-event effects (SEE)
Single Event Latchup (SEL)
fault tolerance |
| Issue Date: | 30-May-2012 |
| Publisher: | Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2012. |
| Citation: | The Fifth Workshop on Fault-Tolerant Spaceborne Computing Employing New Technologies, 2012, Albuquerque, New Mexico, May 29 - June 1, 2012. |
| URI: | http://hdl.handle.net/2014/42682 |
| Appears in Collections: | JPL TRS 1992+
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