NASA Jet Propulsion Laboratory California Institute of Technology Follow this link to skip to the main content

BEACON eSpace at Jet Propulsion Laboratory >
JPL Technical Report Server >
JPL TRS 1992+ >

Please use this identifier to cite or link to this item:

Title: FY11 end of year report for NEPP DDR2 Reliability
Authors: Guertin, Steven M.
Keywords: Double Data Rate (DDR2)
Life Testing
Parametric Testing
Issue Date: Apr-2012
Citation: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2012.
Series/Report no.: JPL Publication
Abstract: This report provides a summary of FY11 hardware, test system, test efforts, data analysis, and recommendations for future work, appropriate to the NASA Electronic Parts and Packaging DDR2 Device Reliability task. Results from reliability testing of Samsung and Micron devices indicate that test methods used provide limited correlation with possible failure mechanisms due to on-die protection from test environments. Recommendations are made for future testing, including focusing on expanded initial characterization which NASA programs can conduct but are time-prohibitive for manufacturers that must produce millions of devices. This report also discusses efforts to develop test systems appropriate for this work.
Appears in Collections:JPL TRS 1992+

Files in This Item:

File Description SizeFormat
JPL Pub 12-11.pdf1.94 MBAdobe PDFView/Open

Items in DSpace are protected by copyright, but are furnished with U.S. government purpose use rights.


Privacy/Copyright Image Policy Beacon Home Contact Us
NASA Home Page + Div 27
+ JPL Space
Site last updated on December 5, 2014.
If you have any comments or suggestions for this web site, please e-mail Robert Powers.