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Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/42144

Title: FY11 end of year report for NEPP DDR2 Reliability
Authors: Guertin, Steven M.
Keywords: Double Data Rate (DDR2)
Reliability
Life Testing
Parametric Testing
Issue Date: Apr-2012
Citation: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2012.
Series/Report no.: JPL Publication
12-11
Abstract: This report provides a summary of FY11 hardware, test system, test efforts, data analysis, and recommendations for future work, appropriate to the NASA Electronic Parts and Packaging DDR2 Device Reliability task. Results from reliability testing of Samsung and Micron devices indicate that test methods used provide limited correlation with possible failure mechanisms due to on-die protection from test environments. Recommendations are made for future testing, including focusing on expanded initial characterization which NASA programs can conduct but are time-prohibitive for manufacturers that must produce millions of devices. This report also discusses efforts to develop test systems appropriate for this work.
URI: http://hdl.handle.net/2014/42144
Appears in Collections:JPL TRS 1992+

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