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|Title: ||A compact, fast, wide-field imaging spectrometer system|
|Authors: ||Mouroulis, Pantazis|
Van Gorp, Byron E
White, Victor E.
Mumolo, Jason M.
|Keywords: ||imaging spectrometry|
|Issue Date: ||26-Apr-2011 |
|Publisher: ||Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011.|
|Citation: ||SPIE Next-Generation Spectroscopic Technologies IV, Orlando, Florida, April 25-26, 2011|
|Abstract: ||We present test results from a compact, fast (F/1.4) imaging spectrometer system with a 33o field of view, operating in the 450-1650 nm wavelength region with an extended response InGaAs detector array. The system incorporates a simple two-mirror telescope and a steeply concave bilinear groove diffraction grating made with gray scale x-ray lithography techniques. High degree of spectral and spatial uniformity (97%) is achieved.|
|Appears in Collections:||JPL TRS 1992+|
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