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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/42076
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| Title: | A compact, fast, wide-field imaging spectrometer system |
| Authors: | Mouroulis, Pantazis
Van Gorp, Byron E
White, Victor E.
Mumolo, Jason M.
Hebert, Daniel
Feldman, Martin |
| Keywords: | imaging spectrometry
Dyson spectrometer
diffraction grating
x-ray lithogrpahy |
| Issue Date: | 26-Apr-2011 |
| Publisher: | Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011. |
| Citation: | SPIE Next-Generation Spectroscopic Technologies IV, Orlando, Florida, April 25-26, 2011 |
| Abstract: | We present test results from a compact, fast (F/1.4) imaging spectrometer system with a 33o field of view, operating in the 450-1650 nm wavelength region with an extended response InGaAs detector array. The system incorporates a simple two-mirror telescope and a steeply concave bilinear groove diffraction grating made with gray scale x-ray lithography techniques. High degree of spectral and spatial uniformity (97%) is achieved. |
| URI: | http://hdl.handle.net/2014/42076 |
| Appears in Collections: | JPL TRS 1992+
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