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Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/41965

Title: NAND flash screening and qualification guideline for space application
Authors: Heidecker, Jason
Keywords: screening
qualifications
NAND Flash
Issue Date: Feb-2012
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2012.
Series/Report no.: JPL Publication
12-1
Abstract: All space missions have a need for nonvolatile memory (NVM), which maintains data integrity when unpowered. Types of NVM include PROM, EEPROM, NOR Flash, and NAND Flash. PROMs, NOR Flash, and EEPROMs are good choices for storing smaller file size data such as boot code or FPGA configurations. These products have excellent data retention characteristics and can reliably store data for years, unpowered, without any data corruption. They can also be read many times without disturbing the data. Another application of NVM is storage of science and engineering data, which requires large of amounts of memory. The highest density memories available today are SDRAM and NAND Flash. However, the power required to operate and store data in NAND Flash is far less than SDRAM. Wherever high density and low power is required, NAND Flash is very attractive.
URI: http://hdl.handle.net/2014/41965
Appears in Collections:JPL TRS 1992+

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