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Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/41964

Title: Modeling the effects of hydrogen and dose rate sensitivity in CMOS and bipolar technologies
Authors: Adell, Philippe
Sanchez, Ivan
Barnaby, Hugh
Keywords: integrated circuits
hydrogen contamination
packaging
enhanced low dose
rate sensitivy
Issue Date: Dec-2011
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2012.
Series/Report no.: JPL Publication
11-17
Abstract: Low dose rate (LDR) and high dose rate (HDR) experiments on field-oxide-field-effect-transistors (FOXFETs) and gated lateral pnp (GLPNP) bipolar transistors indicate that there is a dose rate enhancement factor (EF) associated with radiation-induced degradation. This EF is also affect by the presence of hydrogen in the oxide. In this work, we developed a one dimensional (1-D) numerical calculations code to investigate the key mechanisms that describe the dose rate sensitivity and the effect of hydrogen on dose rate effects. We used a finite-difference methodology for the numerical calculations that allow for computing solutions for the densities of the mobile species as well as for the electrostatic potential at nodes contained within a mesh superimposed on the solution domain. Results from calculations of damage EF indicate that oxide thickness, distribution of hole traps and hole capture cross-section affect dose rate sensitivity. In addition, calculations show that molecular hydrogen cracking at positively charged defects may be a key reaction relating hydrogen and dose rate response. Comparison to experimental data on bipolar and CMOS devices results in good agreement with the dose rate calculations of interface trap buildup
URI: http://hdl.handle.net/2014/41964
Appears in Collections:JPL TRS 1992+

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