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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/41947
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| Title: | Single-Event Effect (SEE) survey of advanced reconfigurable field programmable gate arrays : NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Assurance |
| Authors: | Allen, Gregory |
| Keywords: | Reconfigurable Field-Programmable Gate Array (FPGA)
Xilinx Single-Event Effects (SEE) Test Consortium
single-event upset (SEU)
single-event functional interrupt (SEFI) |
| Issue Date: | Dec-2011 |
| Publisher: | Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011. |
| Series/Report no.: | JPL Publication
11-18 |
| Abstract: | The NEPP Reconfigurable Field-Programmable Gate Array (FPGA) task has been charged to evaluate reconfigurable FPGA technologies for use in space. Under this task, the Xilinx single-event-immune, reconfigurable FPGA (SIRF) XQR5VFX130 device was evaluated for SEE. Additionally, the Altera Stratix-IV and SiliconBlue iCE65 were screened for single-event latchup (SEL). |
| URI: | http://hdl.handle.net/2014/41947 |
| Appears in Collections: | JPL TRS 1992+
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