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Title: Single-Event Effect (SEE) survey of advanced reconfigurable field programmable gate arrays : NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Assurance
Authors: Allen, Gregory
Keywords: Reconfigurable Field-Programmable Gate Array (FPGA)
Xilinx Single-Event Effects (SEE) Test Consortium
single-event upset (SEU)
single-event functional interrupt (SEFI)
Issue Date: Dec-2011
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011.
Series/Report no.: JPL Publication
Abstract: The NEPP Reconfigurable Field-Programmable Gate Array (FPGA) task has been charged to evaluate reconfigurable FPGA technologies for use in space. Under this task, the Xilinx single-event-immune, reconfigurable FPGA (SIRF) XQR5VFX130 device was evaluated for SEE. Additionally, the Altera Stratix-IV and SiliconBlue iCE65 were screened for single-event latchup (SEL).
Appears in Collections:JPL TRS 1992+

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