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Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/41945

Title: Radiation tests of highly scaled, high-density, commercial, nonvolatile NAND flash memories— Update 2011 : NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Assurance
Authors: Irom, Farokh
Nguyen, Duc N.
Keywords: Flash memory
Heavy ion
Single event
Issue Date: Oct-2011
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011
Series/Report no.: JPL Publication
11-8
Abstract: High-density, commercial, nonvolatile flash memories with NAND architecture are now available from several manufacturers. This report examines SEE effects and TID response in single-level cell (SLC) 32Gb and multi-level cell (MLC) 64Gb NAND flash memories manufactured by Micron Technology.
URI: http://hdl.handle.net/2014/41945
Appears in Collections:JPL TRS 1992+

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