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Title: ASIC fault coverage requirements for space application
Authors: Heidecker, Jason
Keywords: digital application-specific integrated circuits (ASICs)
fault coverage
defect detection
Issue Date: Nov-2011
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011.
Series/Report no.: JPL Publication
Abstract: Testable designs of digital application-specific integrated circuits (ASICs) are essential to obtaining highreliability “Hi-Rel” devices. At present, there are no quantifiable requirements in MIL-PRF-38535 or MIL-STD-883 for ASIC test and testability. The purpose of this task is to provide background information regarding ASIC test, testability, and fault coverage, along with a recommendation regarding the level of fault coverage needed to achieve a specified level of reliability for a specified mission duration.
Appears in Collections:JPL TRS 1992+

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