NASA Jet Propulsion Laboratory California Institute of Technology Follow this link to skip to the main content

BEACON eSpace at Jet Propulsion Laboratory >
JPL Technical Report Server >
JPL TRS 1992+ >

Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/41935

Title: ASIC fault coverage requirements for space application
Authors: Heidecker, Jason
Keywords: digital application-specific integrated circuits (ASICs)
testability
fault coverage
reliability
defect detection
Issue Date: Nov-2011
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011.
Series/Report no.: JPL Publication
11-10
Abstract: Testable designs of digital application-specific integrated circuits (ASICs) are essential to obtaining highreliability “Hi-Rel” devices. At present, there are no quantifiable requirements in MIL-PRF-38535 or MIL-STD-883 for ASIC test and testability. The purpose of this task is to provide background information regarding ASIC test, testability, and fault coverage, along with a recommendation regarding the level of fault coverage needed to achieve a specified level of reliability for a specified mission duration.
URI: http://hdl.handle.net/2014/41935
Appears in Collections:JPL TRS 1992+

Files in This Item:

File Description SizeFormat
11-10.pdf1.62 MBAdobe PDFView/Open

Items in DSpace are protected by copyright, but are furnished with U.S. government purpose use rights.

 

Privacy/Copyright Image Policy Beacon Home Contact Us
NASA Home Page + Div 27
+ JPL Space
Site last updated on November 15, 2012.
If you have any comments or suggestions for this web site, please e-mail Alexander Smith or call 4-4202.