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Title: System on a Chip Devices—FY10
Authors: Guertin, Steven M.
Keywords: Radiation Effects
single event effects (SEE)
System-on-a-Chip (SOC)
Issue Date: Dec-2010
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011.
Series/Report no.: JPL Publication
Abstract: This is the final report for the fiscal year (FY) 2010 System-on-a-Chip (SOC) Devices NEPP task. This report describes testing of the Aeroflex UT699 LEON 3FT Sparc™ microprocessor for single event effects (SEE), including examination of anomalies and potential flux and fluence dependence. It describes the test system and reports on data collected for the register file, data cache, instruction cache, and SpaceWire single-event upsets. This task also included review and participation in the NASA test development for the Maestro 49-core multicore microprocessor produced by Boeing. Review of NASA test plans and recommendations for development efforts are made. This task seeks to provide the NASA community with improved methods for SOC testing, with the goal of providing data that is of interest to NASA and that meets the standards of the wider radiation effects community.
Appears in Collections:JPL TRS 1992+

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