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Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/41463

Title: Low-cycle fatigue and dynamic fracture in gold thin films on SiN supported membranes.
Authors: Hays, C. C.
Newell, J. M.
MacNeal, P. D.
Ruiz, R. P.
Holmes, W. A.
Yun, M.
Mulder, J. L.
Koch, T. C.
Bock, J. J.
Lange, A. E.
Keywords: nanotechnology
fatigue
thin films
bolometers
Issue Date: 28-Nov-2005
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2005.
Citation: 2005 Fall Meeting of the Materials Research Society, Symposium Q: Degradation Processes in Nanostructured Materials, Boston, Massachusetts, November 29, 2005
URI: http://hdl.handle.net/2014/41463
Appears in Collections:JPL TRS 1992+

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