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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/41463
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| Title: | Low-cycle fatigue and dynamic fracture in gold thin films on SiN supported membranes. |
| Authors: | Hays, C. C.
Newell, J. M.
MacNeal, P. D.
Ruiz, R. P.
Holmes, W. A.
Yun, M.
Mulder, J. L.
Koch, T. C.
Bock, J. J.
Lange, A. E. |
| Keywords: | nanotechnology
fatigue
thin films
bolometers |
| Issue Date: | 28-Nov-2005 |
| Publisher: | Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2005. |
| Citation: | 2005 Fall Meeting of the Materials Research Society, Symposium Q: Degradation Processes in Nanostructured Materials, Boston, Massachusetts, November 29, 2005 |
| URI: | http://hdl.handle.net/2014/41463 |
| Appears in Collections: | JPL TRS 1992+
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