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Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/41404

Title: Reliability of recolumned area array packages
Authors: Ghaffarian, Reza
Keywords: radiation
array packages
photomicrographs
thermal tests
Issue Date: Mar-2009
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2009.
Series/Report no.: JPL Publication
09-11
Abstract: This report presents qualification guidelines developed for recolumned, high I/O ceramic column grid array (CCGA) packages assembled onto printed wiring/circuit boards (PWBs/PCBs). It includes recolumn and assembly process development for two types of CCGA packages: those with and those without interposer. Thermal cycle test results and photomicrographs showing damage progress for recolumned CCGA assemblies are documented and presented.
URI: http://hdl.handle.net/2014/41404
Appears in Collections:JPL TRS 1992+

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