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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/41262
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| Title: | Flash memory reliability NEPP 2008 task final report |
| Authors: | Chen, Yuan |
| Keywords: | memory
Flash
reliability
NVM |
| Issue Date: | Mar-2009 |
| Publisher: | Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2009. |
| Series/Report no.: | JPL Publication
09-09 |
| Abstract: | This is the preliminary report which is based on the flash memory reliability studies conducted during the first year (2008) of the multi-year NEPP task. The report outlines the technology and reliability challenges for advanced flash memory technologies, summarizes the test results and analyses of reliability characterizations performed on the selected flash memory devices during 2008, and provides the preliminary thoughts on the risk mitigation approaches on using advanced flash memory technologies for space applications. |
| URI: | http://hdl.handle.net/2014/41262 |
| Appears in Collections: | JPL TRS 1992+
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