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Title: Frequency dependence of single-event upset in advanced commercial PowerPC microprocessors
Authors: Irom, Farokh
Farmanesh, F. F.
Keywords: cyclotron
heavy ion
Issue Date: Dec-2004
Publisher: IEEE
Citation: IEEE Transactions on Nuclear Science, Vol. 51, No. 6, p. 3505-3509, December 2004
Abstract: Single-event upset (SEU) from heavy ions is measured for advanced commercial microprocessors in a dynamic mode with clock frequencies up to 1 GHz. Frequency and core voltage dependence of SEUs in registers and D-Cache are discussed. The results of our studies suggest the SEU in registers and D-Cache tend to increase with frequency. This might have important implications for the overall SEU trend as technology moves toward higher frequencies.
Appears in Collections:JPL TRS 1992+

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