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|Title: ||Frequency dependence of single-event upset in advanced commercial PowerPC microprocessors|
|Authors: ||Irom, Farokh|
Farmanesh, F. F.
|Issue Date: ||Dec-2004 |
|Citation: ||IEEE Transactions on Nuclear Science, Vol. 51, No. 6, p. 3505-3509, December 2004|
|Abstract: ||Single-event upset (SEU) from heavy ions is measured for advanced commercial microprocessors in a dynamic mode with clock frequencies up to 1 GHz. Frequency and core voltage dependence of SEUs in registers and D-Cache are discussed. The results of our studies suggest the SEU in registers and D-Cache tend to increase with frequency. This might have important implications for the overall SEU trend as technology moves toward higher frequencies.|
|Appears in Collections:||JPL TRS 1992+|
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