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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/41123
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| Title: | Analysis of single-event upset rates in triple-modular redundancy devices |
| Authors: | Edmonds, Larry D. |
| Keywords: | single-event upset (SEU)
system errors
system rates
raw rate curve |
| Issue Date: | Feb-2009 |
| Publisher: | Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2009. |
| Series/Report no.: | JPL Publication
09-06 |
| Abstract: | Devices hardened against single-event upset (SEU) via triple-modular redundancy (TMR) require unconventional methods for estimating system error rates in a space environment. We cannot simply integrate a cross section versus linear energy transfer (LET) curve with an environmental LET spectrum because “cross section” has a flux dependence. The strategy proposed here is to experimentally measure (at a particle accelerator) system error rates as a function of “raw” (i.e., with TMR disabled) bit-flip rates. The same experiment also measures cross section versus LET for raw bit flips, and this information is used to calculate the raw rate in a space environment. The calculated raw rate together with the measured system rate versus raw rate curve provides an estimate of the system rate. Theoretical predictions of system rate versus raw rate are provided here so that data obtained at flux levels practical for experimental work can be extrapolated to the lower flux levels encountered in space. |
| URI: | http://hdl.handle.net/2014/41123 |
| Appears in Collections: | JPL TRS 1992+
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