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Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/41122

Title: Product reliability trends, derating considerations and failure mechanisms with scaled CMOS
Authors: White, Mark
Vu, Duc
Nguyen, Duc
Ruiz, Ron
Chen, Yuan
Bernstein, Joseph B.
Keywords: accelerated stress testing
advanced technology
CMOS integrated circuits
failure analysis
Issue Date: 16-Oct-2006
Publisher: IEEE
Citation: 2006 International Integrated Reliability Workshop Final Report, Oct. 16, 2006,- Sept. 19, 2006,p. 156 - 159; doi:10.1109/IRWS.2006.305234
Abstract: As microelectronics is scaled into the deep sub-micron regime, space and aerospace users of advanced technology CMOS are reassessing how scaling effects impact long-term product reliability. The effects of electromigration (EM), time-dependent-dielectric-breakdown (TDDB) and hot carrier degradation (HCI and NBTI) wearout mechanisms on scaled technologies and product reliability are investigated, accelerated stress testing across several technology nodes is performed, and FA is conducted to confirm the failure mechanism(s)
URI: http://hdl.handle.net/2014/41122
Appears in Collections:JPL TRS 1992+

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