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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/41028
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| Title: | Radiation tests of highly scaled high density commercial nonvolatile flash memories |
| Authors: | Irom, Farokh
Nguyen, Duc N. |
| Keywords: | dynamic failures
flash memory cells
data loss
failures |
| Issue Date: | Dec-2008 |
| Publisher: | Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2008. |
| Series/Report no.: | JPL Publication
08-27 |
| Abstract: | In recent years there has been increased interest in the possible use of high density commercial nonvolatile flash memories in space because of their high density capabilities and data retention. They are used in a wide variety of spacecraft subsystems. At one end, flash memories are used to store small amounts of mission critical data such as boot code or configuration files. On other end of the spectrum, flash memories are used to construct multi-gigabyte data recorders that are used to record mission data |
| URI: | http://hdl.handle.net/2014/41028 |
| Appears in Collections: | JPL TRS 1992+
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