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http://hdl.handle.net/2014/40825
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| Title: | Commercial sensory survey radiation testing progress report |
| Authors: | Becker, Heidi N.
Dolphic, Michael D.
Thorbourn, Dennis O.
Alexander, James W.
Salomon, Phil M. |
| Keywords: | radiation testing
Micron
unbiased proton irradiation |
| Issue Date: | Apr-2008 |
| Publisher: | Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2008. |
| Series/Report no.: | JPL Publication
08-22 |
| Abstract: | The NASA Electronic Parts and Packaging (NEPP) Program Sensor Technology Commercial Sensor Survey task is geared toward benefiting future NASA space missions with low-cost, short-duty-cycle, visible imaging needs. Such applications could include imaging for educational outreach purposes or short surveys of spacecraft, planetary, or lunar surfaces. Under the task, inexpensive commercial grade CMOS sensors were surveyed in fiscal year 2007 (FY07) and three sensors were selected for total ionizing dose (TID) and displacement damage dose (DDD) tolerance testing. The selected sensors had to meet selection criteria chosen to support small, low-mass cameras that produce good resolution color images. These criteria are discussed in detail in [1]. This document discusses the progress of radiation testing on the Micron and OmniVision sensors selected in FY07 for radiation tolerance testing. |
| URI: | http://hdl.handle.net/2014/40825 |
| Appears in Collections: | JPL TRS 1992+
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