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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/40791
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| Title: | Microelectronics reliability : physics-of-failure based modeling and lifetime evaluation |
| Authors: | White, Mark |
| Keywords: | microelectronics reliability
physics of failure
modelling
root cause analysis
reliability |
| Issue Date: | Feb-2008 |
| Publisher: | Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2008. |
| Series/Report no.: | JPL Publication
08-05 |
| Abstract: | This handbook presents a physics-of-failure approach to microelectronics reliability modeling and assessment. Knowledge of the root cause and physical behavior of key failure mechanisms in microelectronic devices has improved dramatically over recent years and has led to the development of more sophisticated reliability modeling tools and techniques... |
| URI: | http://hdl.handle.net/2014/40791 |
| Appears in Collections: | JPL TRS 1992+
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