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Title: VIRTEX - 4 VQ static SEU characterization summary
Authors: Allen, Gregory
Swift, Gary
Carmichael, Carl
Keywords: QPro-V (Class-V Radiation Hardened)
field programmable gate array (FPGA)
Issue Date: Apr-2008
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2008.
Series/Report no.: JPL Publication
Abstract: This report is the result of the combined efforts of members within the Xilinx Radiation Test Consortium (XRTC), sometimes known as the Xilinx SEE Test Consortium. The XRTC is a voluntary association of aerospace entities, including leading aerospace companies, universities and national laboratories, combining resources to characterize reconfigurable FPGAs for aerospace applications. Previous publications of Virtex-4 radiation results are for commercial (non-epitaxial) devices; see, for example, Refs. 1–4. A notable exception is Ref. 5, which presents XRTC upset measurements of storage elements in the PowerPC405s in the XQR4VFX60. This report of upset susceptibility to heavy ions and protons of the static memory elements in the Virtex-4QV family is a direct parallel to the XRTC report on the thin epitaxial devices in the Virtex-2 family released four years ago
Appears in Collections:JPL TRS 1992+

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