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http://hdl.handle.net/2014/40766
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| Title: | The impact of hydrogen contamination on the Total Dose Response of Linear Bipolar Microcircuits |
| Authors: | Adell, Philippe C.
McClure, Steve S. |
| Keywords: | bipolar test transistors
true dose rate effect
enhanced low dose rate sensitivity (ELDRS)
low dose rate |
| Issue Date: | Apr-2008 |
| Publisher: | Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2008. |
| Series/Report no.: | JPL Publication
08-15 |
| Abstract: | Recent enhanced low dose rate sensitivity (ELDRS) investigations carried out by RLP Research, Crane, Arizona State University (ASU), and Jet Propulsion Laboratory (JPL) have shown significant differences in the degradation of bipolar microcircuits with total dose in the presence of molecular hydrogen (H2) in packages. This has a significant impact on radiation hardness assurance and opens up opportunity to improve device performance. The objectives of this program are 1) to investigate and confirm the causal relationship between packaging recipes, hydrogen contamination, and total dose response of linear bipolar microcircuits; and 2) to develop a guideline that will take into account these effects at the radiation level for future NASA space missions. This program is geared to benefit all future NASA space missions using bipolar or BiCMOS linear devices. |
| URI: | http://hdl.handle.net/2014/40766 |
| Appears in Collections: | JPL TRS 1992+
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