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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/40765
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| Title: | Scaled CMOS technology reliability users guide |
| Authors: | White, Mark
Chen, Yuan |
| Keywords: | scaling theory |
| Issue Date: | May-2008 |
| Publisher: | Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2008. |
| Series/Report no.: | JPL Publication
08-14 |
| Abstract: | This work is sponsored by the NASA Electronic Parts and Packaging (NEPP)
Program. One of the objectives of this task is to prepare a body of knowledge guideline
document summarizing the CMOS technology scaling impact on CMOS parts and parts
reliability for space applications. Scaling impact on parts radiation sensitivity is not
addressed in this report. |
| URI: | http://hdl.handle.net/2014/40765 |
| Appears in Collections: | JPL TRS 1992+
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