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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/40763
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| Title: | Assessing and mitigating radiation effects in Xilinx FPGAs |
| Authors: | Adell, Philippe
Allen, Greg |
| Keywords: | Static Random Access Memory (SRAM)
radiation effects
Field-Programmable Gate Arrays (FPGAs) |
| Issue Date: | Feb-2008 |
| Publisher: | Pasadena, CA : Jet Propulsion Laboratory, California Institute of Technology, 2008 |
| Series/Report no.: | JPL Publication
08-09 |
| Abstract: | The main purpose of this guideline is to document the current understanding of the effort and tradeoffs involved in using SRAM-based FPGAs with maximum achievable upset tolerance. This guideline summarizes the different testing strategies to be considered when assessing the SEE tolerance of SRAM-based FPGAs. For critical applications, in-beam testing of flight designs is strongly recommended in order to verify that the upset mitigation is working as well as the designer intended. At present, there are four manufacturers (Actel, Xilinx, Atmel, and Aeroflex) offering six FPGA types to the military market (i.e., some military spec screening and testing are specified) and four device types to the aerospace application market, which indicates that the manufacturers have added radiation parameter specifications. There is also a Honeywell and BAE Systems device that has been under development for several years, but it does not appear to be available yet; inquiries to Honeywell’s military/aerospace marketing arm on this product have been unanswered. |
| URI: | http://hdl.handle.net/2014/40763 |
| Appears in Collections: | JPL TRS 1992+
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