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http://hdl.handle.net/2014/40465
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| Title: | Absolute distance measurement with the MSTAR sensor |
| Authors: | Lay, Oliver P. Dubovitsky, Serge Peters, Robert Burger, Johan Ahn, Seh-Won Steier, William H. Fetterman, Harrold R. Chang, Yian |
| Keywords: | absolute metrology distance measurement modulation sideband technology for absolute ranging (MSTAR) |
| Issue Date: | 3-Aug-2003 |
| Publisher: | Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2003 |
| Citation: | The International Society for Optical Engineering (SPIE), International Symposium on Optical Science and Technology, San Diego, California, August 3-8, 2003 |
| Abstract: | The MSTAR sensor (Modulation Sideband Technology for Absolute Ranging) is a new system for measuring absolute distance, capable of resolving the integer cycle ambiguity of standard interferometers, and making it possible to measure distance with sub-nanometer accuracy. The sensor uses a single laser in conjunction with fast phase modulators and low frequency detectors. We describe the design of the system - the principle of operation, the metrology source, beamlaunching optics, and signal processing - and show results for target distances up to 1 meter. We then demonstrate how the system can be scaled to kilometer-scale distances. |
| URI: | http://hdl.handle.net/2014/40465 |
| Appears in Collections: | JPL TRS 1992+
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