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Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/40194

Title: Data converters performance at extreme temperatures
Authors: Rejeshuni, Rarnesham
Kumar, Nikil
Mao, James
Keymeulen, Didier
Zebulum, Ricardo S.
Stoica, Adrian
Keywords: evolvable hardware
data converters
extreme environments
Issue Date: 4-Mar-2006
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2006.
Citation: IEEE Aerospace Conference, Big Sky, Montana, March 4-11, 2006.
Abstract: Space missions often require radiation and extreme-temperature hardened electronics to survive the harsh environments beyond earth's atmosphere. Traditional approaches to preserve electronics incorporate shielding, insulation and redundancy at the expense of power and weight. However, a novel way of bypassing these problems is the concept of evolutionary hardware. A reconfgurable device, consisting of several switches interconnected with analog/digital parts, is controlled by an evolutionary processor (EP). When the EP detects degradation in the circuit it sends signals to reconfgure the switches, thus forming a new circuit with the desired output. This concept has been developed since the mid-90s, but one problem remains - the EP cannot degrade substantially. For this reason, extensive testing at extreme temperatures (-180" to 120°C) has been done on devices found on FPGA boards (taking the role of the EP) such as the Analog to Digital and the Digital to Analog Converter. Analysis of the results has shown that FPGA boards implementing EP with some compensation may be a practical solution to evolving circuits. This paper describes results on the tests of data converters at extreme temperatures
URI: http://hdl.handle.net/2014/40194
Appears in Collections:JPL TRS 1992+

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