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Title: An overview of the Nuclear Electric Xenon Ion System (NEXIS) activity
Authors: Randolph, Thomas M.
Polk, James E., Jr.
Keywords: ion thrusters
electric propulsion systems
Issue Date: 12-Jul-2004
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2004.
Citation: Joint Propulsion Conference, Fort Lauderdale, Florida, July 12-14, 2004.
Abstract: Single-event upset from heavy ions is measured for advanced commercial microprocessors in a dynamic mode with clock frequency up to 1GHz. Frequency and core voltage dependence of single-event upsets in registers is discussed.
Appears in Collections:JPL TRS 1992+

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