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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/40035
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| Title: | An overview of the Nuclear Electric Xenon Ion System (NEXIS) activity |
| Authors: | Randolph, Thomas M.
Polk, James E., Jr. |
| Keywords: | ion thrusters
electric propulsion systems |
| Issue Date: | 12-Jul-2004 |
| Publisher: | Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2004. |
| Citation: | Joint Propulsion Conference, Fort Lauderdale, Florida, July 12-14, 2004. |
| Abstract: | Single-event upset from heavy ions is measured for advanced commercial microprocessors in
a dynamic mode with clock frequency up to 1GHz. Frequency and core voltage dependence
of single-event upsets in registers is discussed. |
| URI: | http://hdl.handle.net/2014/40035 |
| Appears in Collections: | JPL TRS 1992+
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