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|Title: ||Results of single-event effects measurements conducted by the Jet Propulsion Laboratory|
|Authors: ||Irom, Farokh|
Miyahira, Tetsuo F.
single-event effect (SEE)
|Issue Date: ||17-Jul-2006 |
|Publisher: ||Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2006.|
|Citation: ||International Nuclear and Space Radiation Effects Conference, Jacksonville, Florida, July 17, 2006.|
|Abstract: ||The studies discussed in this paper were undertaken to establish the sensitivity of the electronic devices to SEL and SEU. SEE measurements were performed on 5 different types of CMOS devices including ADC’s, supervisory circuits, FIFO memory, and a Viterbi decoder.|
|Appears in Collections:||JPL TRS 1992+|
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