NASA Jet Propulsion Laboratory California Institute of Technology Follow this link to skip to the main content

BEACON eSpace at Jet Propulsion Laboratory >
JPL Technical Report Server >
JPL TRS 1992+ >

Please use this identifier to cite or link to this item:

Title: Results of single-event effects measurements conducted by the Jet Propulsion Laboratory
Authors: Irom, Farokh
Miyahira, Tetsuo F.
Keywords: Cyclotron
heavy ions
single-event effect (SEE)
Issue Date: 17-Jul-2006
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2006.
Citation: International Nuclear and Space Radiation Effects Conference, Jacksonville, Florida, July 17, 2006.
Abstract: The studies discussed in this paper were undertaken to establish the sensitivity of the electronic devices to SEL and SEU. SEE measurements were performed on 5 different types of CMOS devices including ADC’s, supervisory circuits, FIFO memory, and a Viterbi decoder.
Appears in Collections:JPL TRS 1992+

Files in This Item:

File Description SizeFormat
06-1868.pdf248.44 kBAdobe PDFView/Open

Items in DSpace are protected by copyright, but are furnished with U.S. government purpose use rights.


Privacy/Copyright Image Policy Beacon Home Contact Us
NASA Home Page + Div 27
+ JPL Space
Site last updated on December 5, 2014.
If you have any comments or suggestions for this web site, please e-mail Robert Powers.