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Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/39717

Title: Results of single-event effects measurements conducted by the Jet Propulsion Laboratory
Authors: Irom, Farokh
Miyahira, Tetsuo F.
Keywords: Cyclotron
heavy ions
single-event effect (SEE)
Latchup
Issue Date: 17-Jul-2006
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2006.
Citation: International Nuclear and Space Radiation Effects Conference, Jacksonville, Florida, July 17, 2006.
Abstract: The studies discussed in this paper were undertaken to establish the sensitivity of the electronic devices to SEL and SEU. SEE measurements were performed on 5 different types of CMOS devices including ADC’s, supervisory circuits, FIFO memory, and a Viterbi decoder.
URI: http://hdl.handle.net/2014/39717
Appears in Collections:JPL TRS 1992+

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