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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/39491
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| Title: | Absolute optical metrology : nanometers to kilometers |
| Authors: | Dubovitsky, Serge
Lay, O. P.
Peters, R. D.
Liebe, C. C. |
| Keywords: | optical metrology |
| Issue Date: | 11-Jul-2005 |
| Publisher: | Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2005.' |
| Citation: | International Quantum Electronics Conference and Pacific Rim Conference on Lasers and Electro-Optics (IQEC/CLEO-PR 2005), Tokyo, Japan, July 11-15, 2005. |
| Abstract: | We provide and overview of the developments in the field of high-accuracy absolute optical metrology with emphasis on space-based applications. Specific work on the Modulation Sideband Technology for Absolute Ranging (MSTAR) sensor is described along with novel applications of the sensor. |
| URI: | http://hdl.handle.net/2014/39491 |
| Appears in Collections: | JPL TRS 1992+
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