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Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/39491

Title: Absolute optical metrology : nanometers to kilometers
Authors: Dubovitsky, Serge
Lay, O. P.
Peters, R. D.
Liebe, C. C.
Keywords: optical metrology
Issue Date: 11-Jul-2005
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2005.'
Citation: International Quantum Electronics Conference and Pacific Rim Conference on Lasers and Electro-Optics (IQEC/CLEO-PR 2005), Tokyo, Japan, July 11-15, 2005.
Abstract: We provide and overview of the developments in the field of high-accuracy absolute optical metrology with emphasis on space-based applications. Specific work on the Modulation Sideband Technology for Absolute Ranging (MSTAR) sensor is described along with novel applications of the sensor.
URI: http://hdl.handle.net/2014/39491
Appears in Collections:JPL TRS 1992+

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