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|Title: ||Absolute optical metrology : nanometers to kilometers|
|Authors: ||Dubovitsky, Serge|
Lay, O. P.
Peters, R. D.
Liebe, C. C.
|Keywords: ||optical metrology|
|Issue Date: ||11-Jul-2005 |
|Publisher: ||Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2005.'|
|Citation: ||International Quantum Electronics Conference and Pacific Rim Conference on Lasers and Electro-Optics (IQEC/CLEO-PR 2005), Tokyo, Japan, July 11-15, 2005.|
|Abstract: ||We provide and overview of the developments in the field of high-accuracy absolute optical metrology with emphasis on space-based applications. Specific work on the Modulation Sideband Technology for Absolute Ranging (MSTAR) sensor is described along with novel applications of the sensor.|
|Appears in Collections:||JPL TRS 1992+|
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