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|Title: ||Model validation of SIM external metrology at the sub-nanometer level|
|Authors: ||Nemati, Bijan|
Kuan, Gary M.
Space Interferometry Mission (SIM)
|Issue Date: ||21-Jun-2004 |
|Publisher: ||Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2004.|
|Citation: ||SPIE Astronomical Telescopes and Instrumentiation 2004, Glosgow, Scotland, United Kingdom, June 21-25, 2004.|
|Abstract: ||In order to achieve micro-arcsecond astrometry, SIM must make measurements of various optical path lengths at the picometer level. In this regime of precision, nearly every simplifying assumption in optics must be reexamined as a potential source of systematic error. SIM makes extensive use of physics-based models to predict the form and level of systematic errors affecting instrument performance. Since many of the modeling areas represent new frontiers in optical modeling, the validation of these physical models is a significant challenge that SIM must meet. In the case of the external metrology truss, the model must account for the imperfections in the corner cubes as well as the distance measuring interferometers ("beam launchers"). This model is being validated using the Kite testbed, a 2-D metrology truss with picometer-level accuracy in displacement measurements. We present the model and the results of the model validation tests on the Kite testbed.|
|Appears in Collections:||JPL TRS 1992+|
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