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Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/38909

Title: On-wafer vector network analyzer measurements in the 220-325 Ghz frequency band.
Authors: Fung, King Man Andy
Dawson, D.
Samoska, L.
Lee, K.
Oleson, C.
Boll, G.
Keywords: MMIC amplifier
vector network analyzer (VNA)
coplanar transmission lines
coplanar waveguides
measurement
Issue Date: 11-Jun-2006
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2006.
Citation: IEEE MTT-S International Microwave Symposium, San Francisco, California, June 11-16, 2006.
Abstract: We report on a full two-port on-wafer vector network analyzer test set for the 220-325 GHz (WR3) frequency band. The test set utilizes Oleson Microwave Labs frequency extenders with the Agilent 8510C network analyzer. Two port on-wafer measurements are made with GGB Industries coplanar waveguide (CPW) probes. With this test set we have measured the WR3 band S-parameters of amplifiers on-wafer, and the characteristics of the CPW wafer probes. Results for a three stage InP HEMT amplifier show 10 dB gain at 235 GHz [1], and that of a single stage amplifier, 2.9 dB gain at 231 GHz. The approximate upper limit of loss per CPW probe range from 3.0 to 4.8 dB across the WR3 frequency band.
URI: http://hdl.handle.net/2014/38909
Appears in Collections:JPL TRS 1992+

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