NASA Jet Propulsion Laboratory California Institute of Technology Follow this link to skip to the main content

BEACON eSpace at Jet Propulsion Laboratory >
JPL Technical Report Server >
JPL TRS 1992+ >

Please use this identifier to cite or link to this item:

Title: Electrical and structural investigation of the effects of via-conductor geometry in the electromigration of AL:CU
Authors: Leon, R.
Vu, D.
Johnson, A. S.
Ruiz, R.
Okuno, J.
Uribe, J.
Hather, G.
Lloyd, . R.
Issue Date: Nov-2001
Citation: Fall Meeting of the Materials Research Society
Boston, MA, USA
Abstract: Electromigration experiments, their results at different densities.
Appears in Collections:JPL TRS 1992+

Files in This Item:

File SizeFormat
01-2572.pdf43.62 kBAdobe PDFView/Open

Items in DSpace are protected by copyright, but are furnished with U.S. government purpose use rights.


Privacy/Copyright Image Policy Beacon Home Contact Us
NASA Home Page + Div 27
+ JPL Space
Site last updated on December 5, 2014.
If you have any comments or suggestions for this web site, please e-mail Robert Powers.