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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/36474
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| Title: | The Properties of CrN/Au and Cr/CrN/Au Multilayers |
| Authors: | Kolawa, E.
Lie, D.
Reid, J.
Tai, B.
Lowry, L.
Scott-Monck, J. |
| Issue Date: | 25-Apr-1994 |
| Citation: | International Conference of Metallurgical Coatings and Thin Films
San Diego, California, USA |
| Abstract: | Gold has been used as a conductor material in many microelectronic applications because of its low resistivity, bondability, and oxidation/corrosion resistance. |
| URI: | http://hdl.handle.net/2014/36474 |
| Appears in Collections: | JPL TRS 1992+
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