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|Title: ||Electron Mobility Studies of Device Quality InAs/GaAs Short Period Supprlattices Grown by Dynamic Stoichiometry Control and Floating In Flash-off Methods|
|Authors: ||Grunthaner, F. J.|
Zang, D. P.
Liu, J. K.
Pike, W. T.
Spencer, M. G.
|Issue Date: ||23-Aug-1993 |
|Citation: ||Garmisch-Partenkirchen, Germany|
|Abstract: ||The Strained Layer InGaAs/GaAs system has been the subject of substantial work emphasizing both growth studies and device applications. Relatively few studies have successfully explored the binary InAs on GaAs system because of the difficulties of maintaining a specular growth front and the apparently small value of the critical thickness.|
|Appears in Collections:||JPL TRS 1992+|
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