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Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/35629

Title: GaAs Reliability Database
Authors: Sacco, T.
Gonzalez, S.
Kayali, S.
Issue Date: 10-Oct-1993
Citation: San Jose, California, USA
Abstract: The database consists of two main sections, the data references and the device reliability records. The reference section contains 8 fields: reference number, date of publication, authors, article title, publisher, volume, and page numbers.
URI: http://hdl.handle.net/2014/35629
Appears in Collections:JPL TRS 1992+

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