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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/35629
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| Title: | GaAs Reliability Database |
| Authors: | Sacco, T.
Gonzalez, S.
Kayali, S. |
| Issue Date: | 10-Oct-1993 |
| Citation: | San Jose, California, USA |
| Abstract: | The database consists of two main sections, the data references and the device reliability records. The reference section contains 8 fields: reference number, date of publication, authors, article title, publisher, volume, and page numbers. |
| URI: | http://hdl.handle.net/2014/35629 |
| Appears in Collections: | JPL TRS 1992+
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