|
BEACON eSpace at Jet Propulsion Laboratory >
JPL Technical Report Server >
JPL TRS 1992+ >
Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/35257
|
| Title: | Mechanical Stress Effects on Electromigration Voiding in a Meandering Test Stripe |
| Authors: | Lowry, L. E.
Tai, B. H.
Mattila, J.
Walsh, L. H. |
| Issue Date: | Apr-1993 |
| Citation: | San Francisco, California, USA |
| Abstract: | Earlier experimental findings concluded that electromigratin voids in these meandering stripe test structures were not randomly distributed and that void nucleation frequenly occurred sub-surface at the metal/thermal oxide interface. |
| URI: | http://hdl.handle.net/2014/35257 |
| Appears in Collections: | JPL TRS 1992+
|
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
|
