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Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/33851

Title: Functional Variation of Dual Gate MOS-JFET CCD Test Structure
Authors: Kim, Q.
Zakharia, M.
Issue Date: 4-Apr-1994
Citation: Open Meeting
Orlando, Florida, USA
Abstract: Drain voltages of a test structure of dual gate MOS-JFET CCD (TIJ J032) were measured by an advance laser scanner.
URI: http://hdl.handle.net/2014/33851
Appears in Collections:JPL TRS 1992+

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