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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/33851
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| Title: | Functional Variation of Dual Gate MOS-JFET CCD Test Structure |
| Authors: | Kim, Q.
Zakharia, M. |
| Issue Date: | 4-Apr-1994 |
| Citation: | Open Meeting
Orlando, Florida, USA |
| Abstract: | Drain voltages of a test structure of dual gate MOS-JFET CCD (TIJ J032) were measured by an advance laser scanner. |
| URI: | http://hdl.handle.net/2014/33851 |
| Appears in Collections: | JPL TRS 1992+
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