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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/32097
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| Title: | Ballistic-Electron-Emission Microscopy: A Nanometer-Scale Probe of Interfaces |
| Authors: | Bell, L. D.
Kaiser, W. J. |
| Issue Date: | 1995 |
| Citation: | Annual Review of Materials Science |
| Abstract: | The investigation of semiconductor interfaces is complicated by their |
| URI: | http://hdl.handle.net/2014/32097 |
| Appears in Collections: | JPL TRS 1992+
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