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Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/32097

Title: Ballistic-Electron-Emission Microscopy: A Nanometer-Scale Probe of Interfaces
Authors: Bell, L. D.
Kaiser, W. J.
Issue Date: 1995
Citation: Annual Review of Materials Science
Abstract: The investigation of semiconductor interfaces is complicated by their
URI: http://hdl.handle.net/2014/32097
Appears in Collections:JPL TRS 1992+

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