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|Title: ||Ballistic-Electron-Emission Microscopy: A Nanometer-Scale Probe of Interfaces|
|Authors: ||Bell, L. D.|
Kaiser, W. J.
|Issue Date: ||1995 |
|Citation: ||Annual Review of Materials Science|
|Abstract: ||The investigation of semiconductor interfaces is complicated by their|
|Appears in Collections:||JPL TRS 1992+|
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