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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/31195
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| Title: | Hardness Assurance and Testing Techniques for High Resolution (12- to 16-bit) Analog-to-Digital Converters |
| Authors: | Lee, C. I.
Rax, B. G.
Johnston, A. H. |
| Issue Date: | Jul-1995 |
| Citation: | IEEE Transaction on Nuclear Science (1995)
Madison, WI |
| Abstract: | Discussed are hardness assurance and testing techniques to test and evaluate total dose radiation degradation of high resolution A/D converters. Because high-speed, high-resolution converters are critical parts in a digital signal processing or data acquisition system, the evaluation of performance in the early design phase is very important. Converters from three manufacturers are evaluated. |
| URI: | http://hdl.handle.net/2014/31195 |
| Appears in Collections: | JPL TRS 1992+
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