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Title: Hardness Assurance and Testing Techniques for High Resolution (12- to 16-bit) Analog-to-Digital Converters
Authors: Lee, C. I.
Rax, B. G.
Johnston, A. H.
Issue Date: Jul-1995
Citation: IEEE Transaction on Nuclear Science (1995)
Madison, WI
Abstract: Discussed are hardness assurance and testing techniques to test and evaluate total dose radiation degradation of high resolution A/D converters. Because high-speed, high-resolution converters are critical parts in a digital signal processing or data acquisition system, the evaluation of performance in the early design phase is very important. Converters from three manufacturers are evaluated.
Appears in Collections:JPL TRS 1992+

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