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|Title: ||Hardness Assurance and Testing Techniques for High Resolution (12- to 16-bit) Analog-to-Digital Converters|
|Authors: ||Lee, C. I.|
Rax, B. G.
Johnston, A. H.
|Issue Date: ||Jul-1995 |
|Citation: ||IEEE Transaction on Nuclear Science (1995)|
|Abstract: ||Discussed are hardness assurance and testing techniques to test and evaluate total dose radiation degradation of high resolution A/D converters. Because high-speed, high-resolution converters are critical parts in a digital signal processing or data acquisition system, the evaluation of performance in the early design phase is very important. Converters from three manufacturers are evaluated.|
|Appears in Collections:||JPL TRS 1992+|
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