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Title: Hardness Assurance and Testing Techniques for High Resolution
Authors: Lee, C.I.
Rax, B.G.
Johnston, A.H.
Issue Date: Jul-1995
Citation: IEEE Transactions on Nuclear Science (1995)
Madison, WI
Abstract: Many different analog-to-digital converters (ADCs) have been
Appears in Collections:JPL TRS 1992+

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