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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/30706
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| Title: | Hardness Assurance and Testing Techniques for High Resolution |
| Authors: | Lee, C.I.
Rax, B.G.
Johnston, A.H. |
| Issue Date: | Jul-1995 |
| Citation: | IEEE Transactions on Nuclear Science (1995)
Madison, WI |
| Abstract: | Many different analog-to-digital converters (ADCs) have been |
| URI: | http://hdl.handle.net/2014/30706 |
| Appears in Collections: | JPL TRS 1992+
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