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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/30345
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| Title: | Ballistic-Electron-Emission Microscopy of Strain Non-Uniformities in Si<sub>1-x</sub>Ge<sub>x</sub>/Si Structure |
| Authors: | Bell, L. D. |
| Issue Date: | Jul-1995 |
| Citation: | Physical Review B |
| URI: | http://hdl.handle.net/2014/30345 |
| Appears in Collections: | JPL TRS 1992+
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