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Title: Hardness Assurance Techniques for New Generation COTS Devices
Authors: Lee, C. I.
Rax, B. G.
Johnston, A. H.
Issue Date: 15-Jul-1996
Citation: Indian Wells, California, USA
Abstract: Hardness Assurance (HA) techniques and total dose radiation characterization data for new generation linear and COTS devices from various manufacturers are presented. A bipolar op amp showed significant degradation at HDR, not at low dose rate environment. New generation low-power op amps showed more degradation at low voltage applications. HA test techniques for COTS devices are presented in this paper.
Appears in Collections:JPL TRS 1992+

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