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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/26069
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| Title: | Hardness Assurance Techniques for New Generation COTS Devices |
| Authors: | Lee, C. I.
Rax, B. G.
Johnston, A. H. |
| Issue Date: | 15-Jul-1996 |
| Citation: | Indian Wells, California, USA |
| Abstract: | Hardness Assurance (HA) techniques and total dose radiation characterization data for new generation linear and COTS devices from various manufacturers are presented. A bipolar op amp showed significant degradation at HDR, not at low dose rate environment. New generation low-power op amps showed more degradation at low voltage applications. HA test techniques for COTS devices are presented in this paper. |
| URI: | http://hdl.handle.net/2014/26069 |
| Appears in Collections: | JPL TRS 1992+
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