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|Title: ||Hardness Assurance Techniques for New Generation COTS Devices|
|Authors: ||Lee, C. I.|
Rax, B. G.
Johnston, A. H.
|Issue Date: ||15-Jul-1996 |
|Citation: ||Indian Wells, California, USA|
|Abstract: ||Hardness Assurance (HA) techniques and total dose radiation characterization data for new generation linear and COTS devices from various manufacturers are presented. A bipolar op amp showed significant degradation at HDR, not at low dose rate environment. New generation low-power op amps showed more degradation at low voltage applications. HA test techniques for COTS devices are presented in this paper.|
|Appears in Collections:||JPL TRS 1992+|
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