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Title: Heavy Ion and Proton Induced Single Event Transients in Linear Devices
Authors: Nichols, D. K.
Coss, J. R.
Miyahira, T.
Schwartz, H. R.
Issue Date: 27-Jun-1996
Citation: Indian Wells, California, USA
Abstract: This paper presents a display of heavy-ion and proton-induced single event transients for selected linear devices. The transient vital signs are serious; low LET threshold, high voltage amplitude and extended pulse duration (microsecs.).
Appears in Collections:JPL TRS 1992+

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