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|Title: ||Heavy Ion and Proton Induced Single Event Transients in Linear Devices|
|Authors: ||Nichols, D. K.|
Coss, J. R.
Schwartz, H. R.
|Issue Date: ||27-Jun-1996 |
|Citation: ||Indian Wells, California, USA|
|Abstract: ||This paper presents a display of heavy-ion and proton-induced single event transients for selected linear devices. The transient vital signs are serious; low LET threshold, high voltage amplitude and extended pulse duration (microsecs.).|
|Appears in Collections:||JPL TRS 1992+|
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