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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/26065
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| Title: | Heavy Ion and Proton Induced Single Event Transients in Linear Devices |
| Authors: | Nichols, D. K.
Coss, J. R.
Miyahira, T.
Schwartz, H. R. |
| Issue Date: | 27-Jun-1996 |
| Citation: | Indian Wells, California, USA |
| Abstract: | This paper presents a display of heavy-ion and proton-induced single event transients for selected linear devices. The transient vital signs are serious; low LET threshold, high voltage amplitude and extended pulse duration (microsecs.). |
| URI: | http://hdl.handle.net/2014/26065 |
| Appears in Collections: | JPL TRS 1992+
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