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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2014/23006
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| Title: | Ballistic-electron-emission Microscopy of Semiconductor Heterostructures |
| Authors: | Bell, L. Douglas
Narayanamurti, Venkatesh |
| Issue Date: | Nov-1997 |
| Citation: | United Kingdom |
| Abstract: | Balistic-electron-emission microscopy has developed from its beginning as a probe of Schottky barriers into a powerful nanometer-scale method for characterizing semiconductor interfaces and hot-electron transport. |
| URI: | http://hdl.handle.net/2014/23006 |
| Appears in Collections: | JPL TRS 1992+
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