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Please use this identifier to cite or link to this item: http://hdl.handle.net/2014/23006

Title: Ballistic-electron-emission Microscopy of Semiconductor Heterostructures
Authors: Bell, L. Douglas
Narayanamurti, Venkatesh
Issue Date: Nov-1997
Citation: United Kingdom
Abstract: Balistic-electron-emission microscopy has developed from its beginning as a probe of Schottky barriers into a powerful nanometer-scale method for characterizing semiconductor interfaces and hot-electron transport.
URI: http://hdl.handle.net/2014/23006
Appears in Collections:JPL TRS 1992+

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